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Updated: Jul 16, 2025

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
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聚焦离子束断层扫描技术的进展,用于材料科学中的三维表征

Francesco Mura1, Flavio Cognigni1, Matteo Ferroni2,3

  • 1Department of Basic and Applied Sciences, University of Rome "La Sapienza", Via Antonio Scarpa 14, 00161 Rome, Italy.

Materials (Basel, Switzerland)
|September 9, 2023
PubMed
概括

聚焦离子束扫描电子显微镜 (FIB-SEM) 断层扫描能够进行详细的3D纳米级重建. 在FIB-SEM和AI的进步有望提高分辨率,自动化和材料表征的更广泛应用.

关键词:
3D重建的重建是3D重建.FIB-SEM 断层扫描 FIB-SEM 断层扫描多孔材料系统是多孔材料系统.细分化 细分化的细分化

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