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Updated: Jul 16, 2025

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声学显微镜中的自动倾斜补偿

Shubham Kumar Gupta1, Anowarul Habib2, Prakhar Kumar3

  • 1Department of Chemical Engineering, Indian Institute of Technology, Guwahati, India.

Journal of microscopy
|September 12, 2023
PubMed
概括

本研究引入了一种自动化方法,用于纠正由样品倾斜引起的扫描声学显微镜 (SAM) 飞行时间转移. 新的曲线拟合技术通过精确补偿倾斜诱导的错误来提高3D成像的准确性.

关键词:
扫描声学显微镜扫描声学显微镜倾斜的纠正,倾斜的纠正.转换器 转换器 转换器超声波是一种超声波.

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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