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牛顿环干涉测量应用用于2D镜头阵列对齐与微米精度的微米精度

Łukasz Gorajek, Przemysław Gontar, Jan Jabczyński

|September 14, 2023

概括

使用牛顿环干扰计 (NRI) 的新方法精确地对准二维 (2D) 镜头阵列. 这种技术达到微米准确度,克服了先进光学系统连贯光束组合的挑战.

科学领域:

光学是什么?光学是什么?光学是什么?
光学工程是指光学工程.
干涉测量是干涉测量的方法.

背景情况:

2D镜头阵列的密集包装需要高倾斜和分散精度,以实现连贯光束组合.
聚合器镜头参数和二维镜头阵列对齐带来了重大的技术挑战.

研究的目的:

提出和验证一种使用牛顿环干扰测量 (NRI) 进行二维镜头阵列对齐的新方法.
建立一个分析模型和算法来估计对齐灵敏度.
为了证明2D镜头阵列对齐中的微米精度.

主要方法:

开发一种分析模型和算法,用于对齐灵敏度估计.
设计和实施光学设置,使用牛顿环干扰测量进行对齐测试.
拟议的对齐方法的实验验证.

主要成果:

开发的分析模型和算法准确估计了对齐灵敏度.
实验验证证了NRI对于精确的二维镜头阵列对齐的能力.
在对齐过程中成功证明了微米的灵敏度和准确性.

结论:

拟议的牛顿环干扰测量方法为实现高精度的2D镜头阵列对齐提供了可行的解决方案.
该研究表明,在光学元件对齐方面,微米级精度的可行性.
进一步的研究可以探索这种基于NRI的对齐技术的改进和更广泛的应用.

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