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基于Zynq SoC的高性能相位测量分析架构.

Fei Fan, Jiehu Kang, Luyuan Feng

    Applied optics
    |September 14, 2023
    PubMed
    概括

    这项研究引入了一种新的异质计算架构,用于使用相位测量特征测量 (PMP) 进行3D形状测量. 该系统实现实时,高精度的结果,显著减少计算时间和功耗.

    科学领域:

    • 计算机视觉 计算机视觉
    • 嵌入式系统工程 嵌入式系统工程
    • 计量学 计量学 计量学

    背景情况:

    • 阶段测量形计 (PMP) 对于3D形状测量至关重要.
    • 现有的实施方案经常在嵌入式应用程序中的实时处理需求和功率效率方面扎.

    研究的目的:

    • 开发一种新的高性能异质计算架构,用于立体结构光3D测量.
    • 为了实现实时和高精度的3D形状测量,使用PMP算法在Zynq UltraScale+芯片系统 (SoC) 上.

    主要方法:

    • 在Zynq UltraScale+ SoC上实现异质计算架构.
    • 使用相位测量特征测量 (PMP) 算法进行3D重建.
    • 对Raspberry Pi和高端PC上的软件实现进行性能评估.

    主要成果:

    • 拟议的架构为1280x1024分辨率的PMP算法实现了14.11毫秒的计算时间.
    • 与优化的Raspberry Pi软件相比,其速度提升了51倍,而高端PC的速度提升了3倍.
    • 与现有解决方案相比,实现了15倍低的功耗.

    结论:

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  • 这种新的架构可以实现实时,高精度的3D形状测量.
  • 该系统为嵌入式应用提供了显著的性能和功率效率优势.
  • Zynq UltraScale+ SoC非常适合要求实时的3D计量任务.