在测量应变场时,TEM样本厚度的重要性
Sangjun Kang1, Di Wang2, Christian Kübel3
1Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen 76344, Germany; Joint Research Laboratory Nanomaterials, Technical University of Darmstadt (TUDa), Darmstadt 64287, Germany.
Ultramicroscopy
|September 14, 2023
概括
传输电子显微镜 (TEM) 样品厚度对于准确的菌株映射至关重要. 过度稀释样品会改变原子结构,危及原生变形分析.
科学领域:
- 材料科学 材料科学 材料科学
- 凝聚物质物理学 凝聚物质物理学
- 纳米技术 纳米技术
背景情况:
- 传输电子显微镜 (TEM) 对于应变场分析至关重要,提供高空间分辨率.
- 薄型标本是TEM的标准,以确保电子透明度并最大限度地减少文物.
- 样品稀释对残留菌株和原子结构的影响仍然是一个关键问题.
研究的目的:
- 系统地调查TEM样本厚度如何影响残余应变场.
- 为了量化金属玻璃的稀释引起的结构变化.
- 为了确定准确的应变测量所需的最小样本厚度.
主要方法:
- 使用的传输电子显微镜 (TEM) 和4D-STEM.
- 检查了变形的基于Fe和基于Zr的金属玻璃.
- 从300nm逐渐稀释到70nm的样本,分析相同的区域.
主要成果:
- 样品稀释显著影响短程 (SR) 和中程 (MR) 尺度上的原子配置.
- 过度稀释导致本地变形结构的损失.
- 通过减少样本厚度,残余应变场被明显改变.
结论:
- 充分的样本厚度对于在TEM分析中保留原生变形结构至关重要.
- 不准确的应变测量可能来自过于薄的TEM样本.
- 仔细考虑样本厚度对于使用TEM进行可靠的菌株映射至关重要.
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