沿着植入物-支架接口的微漏洞:对体外研究的系统审查和元分析

Zhen Mao1, Florian Beuer1, Daomin Wu2

  • 1Charité-Universitaetsmedizin Berlin, Corporate Member of Freie Universität Berlin and Humboldt- Universitaet zu Berlin, Dental Materials and Biomaterial Research, Department of Prosthodontics, Geriatric Dentistry and Craniomandibular Disorders, Aßmannshauser Str. 4-6, 14197, Berlin, Germany.

概括

微漏事件 (IME) 在近一半的牙科植入物样本中发生. 动态加载显著增加了在植入物-支架接口 (IAI) 的细菌透率,突出了标准化体外研究的需要.

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