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射线断层扫描晶体表征:自动3D细分

Gautier Hypolite¹, Jérôme Vicente², Philippe Moulin¹

¹Equipe Procédés Membranaires (EPM), Aix Marseille Univ., CNRS, Centrale Marseille, (M2P2 UMR 7340), Equipe Procédés Membranaires (EPM), Europôle de l'Arbois, BP80, Pavillon Laennec, Hall C, France.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

|September 25, 2023

概括

这项研究引入了一种使用微型X射线计算机断层扫描的新3D晶体成像方法. 这种新的方法显著提高了晶体细分的准确性,与传统的流域方法相比,减少了87%的过分细分.

科学领域:

晶体学晶体学是指结晶学.
材料科学材料科学材料科学
图像分析图像分析

背景情况:

准确的晶体结构参数分析对于制药和化学工业至关重要.
现有的晶体细分方法,如分水,经常遭受过分细分.
微型X射线计算机断层扫描 (micro-CT) 提供了详细的3D晶体成像.

研究的目的:

开发和评估一种用于3D微型CT图像的新晶体细分方法.
为了提高细分的准确性比传统的流域技术.
为了能够更精确地分析晶体结构参数.

主要方法:

开发了一种基于表面平面识别的新细分方法.
该方法应用于通过微型X射线计算机断层扫描获得的3D晶体图像.
用合成图像和真实晶体样本 (,,硫酸铜) 评估细分性能.

主要成果:

与最终侵蚀的流域相比,拟议的方法显著减少了87%的过分分割.
算法保持了识别的晶体颗粒的凸度.
在各种晶体样本上证明了成功的应用.

结论:

这种基于平面识别的新型细分方法为3D晶体成像提供了卓越的性能.
这一进步有助于在晶体生长研究中进行更准确的结构分析.
该方法具有提高化学和制药领域质量控制和研究的潜力.

关键词:

分段化分段化分段化分段化射线断层扫描X射线断层扫描的结晶化过程.表面识别功能表面识别功能

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