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用传输电子显微镜测量谷物边界平面自动化晶体学定向绘图用于原子探头断层学标本的测量

Matthew Hartshorne^1,2, Asher Leff^1,3, Gregory Vetterick^1,4

¹Department of Materials Science and Engineering, Drexel University, 3141 Chestnut St., Philadelphia, PA 19104, USA.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

|September 25, 2023

概括

这项研究引入了一种新的传输电子显微镜方法,用于精确测量颗粒边界的所有五个参数. 这种技术增强了材料性质分析,特别是在原子探头断层扫描标本上.

科学领域:

材料科学材料科学材料科学
晶体学晶体学是指结晶学.
电子显微镜电子显微镜

背景情况:

颗粒边界显著影响材料特性,如机械稳定性,导电性和耐腐蚀性.
材料特性取决于晶体误导和粒度边界平面角度,这五个关键参数.
传统的方法很难完全描述所有五个粒度边界参数.

研究的目的:

介绍一种用于直接测量所有五个粒度边界参数的新方法.
为了在传输电子显微镜样本中实现全面的粒度边界分析.
为了促进结晶学数据与原子探头断层扫描中的化学数据的匹配.

主要方法:

使用传输电子显微镜直接测量五个粒度边界参数.
适用于各种样本形态,包括原子探头样本.
与原子探头断层扫描集成,用于结合晶体学和化学分析.

主要成果:

成功地直接测量了所有五个粒度边界参数.
对单倾斜原子探头标本的应用性得到证明.
实现了高效的谷物边界分析,易于获取和解释.

结论:

提出的方法为高效和全面的谷物边界分析提供了一个平台.
它克服了传统电子衍射方法的局限性,特别是对于独特的样品.
这一进步有助于基于详细的粒度边界表征来理解和预测材料特性.

关键词:

原子探头断层扫描 (tomography) 是一种原子探头断层扫描.结晶学结晶学是指结晶学.电子衍射的电子衍射方式谷物边界平面是谷物边界平面.传输电子显微镜的使用

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