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Updated: Jul 15, 2025

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
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在分析场离子显微镜中改进空间和元素关联

Felipe F Morgado1, Leigh Stephenson1, Loic Rousseau2

  • 1Department of Metal Physics and Alloy Design, Max Planck Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 25, 2023
PubMed
概括

这项研究增强了分析场离子显微镜 (aFIM) 的精确材料分析. 新的算法显著改善了信号到背景,使得单个同位素和元素在原子水平上的清晰识别成为可能.

关键词:
分析场离子显微镜分析场离子显微镜原子探头断层扫描 (tomography) 是一种原子探头断层扫描.原子分辨率的原子分辨率相关性过的相关性过.飞行时间频谱测量

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