相关实验视频

Updated: Jul 15, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

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一种新的初级方法来确定AFM球体内的尖端半径和Young的模块

Stylianos Vasileios Kontomaris1,2, Andreas Stylianou3, Georgios Chliveros1

  • 1Faculty of Engineering and Architecture, Metropolitan College, 15125 Athens, Greece.

Micromachines
|September 28, 2023
PubMed
概括

这项研究提出了一种新方法,可以轻松确定原子力显微镜 (AFM) 纳米印探针的尖端半径. 这种校准技术通过使用单一的力缩曲线来简化生物材料的表征.

关键词:
在AFM格子中,使用的是AFM格子.生物材料是生物材料.球形缩水器的校准 球形缩水器的校准处理数据的数据处理.智能飞行控制系统 (AFM) 是一种智能飞行控制系统.机械性能 机械性能 机械性能

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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