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相关概念视频

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

9.2K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.4K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.4K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

5.6K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
5.6K
Cryo-electron Microscopy01:28

Cryo-electron Microscopy

3.4K
Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...
3.4K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.3K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.3K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

10.4K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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相关实验视频

Updated: Jul 15, 2025

Author Spotlight: Advancements in Correlative Light and Electron Microscopy with Fluorescent Protein Preservation
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Author Spotlight: Advancements in Correlative Light and Electron Microscopy with Fluorescent Protein Preservation

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光发射电子显微镜用于连接学.

Kevin M Boergens, Gregg Wildenberg, Ruiyu Li

    bioRxiv : the preprint server for biology
    |September 29, 2023
    PubMed
    概括

    光发射电子显微镜 (PEEM) 提供了一种新的,快速的方法,以突触分辨率对神经回路进行成像. 这种技术补充了现有的电子显微镜 (EM) 方法,可能加速连接学研究.

    科学领域:

    • 神经科学是一个神经科学.
    • 显微镜的使用方法
    • 生物物理学的生物物理.

    背景情况:

    • 连接学,神经电路的映射,严重依赖于串行电子显微镜 (EM).
    • 目前的传输电子显微镜 (TEM) 和扫描电子显微镜 (SEM) 等方法在大规模连接体成像时面临速度和样品处理的限制.
    • 达到突触分辨率对于理解神经电路功能至关重要.

    结论:

    • PEEM为连接学提供了第三种可行的电子显微镜技术,结合了TEM和SEM的优势.
    • 它可以在坚固的基板上准备可靠的样品,并提供快速的广场成像.
    • PEEM有可能显著加速下一代神经电路映射的数据采集.

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