,SNR

Yuqing Cui1, Yafei Xu1, Donghai Han1

  • 1State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, People's Republic of China.

Science advances
|October 4, 2023
PubMed
概括

本研究引入了太赫兹时域光谱法,用于对分层结构进行非侵入性检查. 该技术克服了信号限制,使得高分辨率成像和材料内容分析成为可能.