触角极紫外线和软X射线诊断系统用于在高贝塔托卡马克扩展脉冲上的时间分辨率温度测量
Boting Li1, J P Levesque1, Y Wei1
1Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA.
The Review of scientific instruments
|October 5, 2023
概括
高贝塔托卡马克扩展脉冲中的新诊断系统测量了电子温度和模式动态. 这种新的触角视图系统对于核心等离子体研究和分析磁动力学现象 (如牙) 有效.
科学领域:
- 等离子体物理学的物理学
- 融合能源研究 融合能源研究
- 托卡马克诊断公司
背景情况:
- 托卡马克设备需要精确测量电子温度和等离子体动态,以进行操作控制和研究.
- 现有的诊断系统通常在视角或温度范围方面存在局限性,需要新的方法.
研究的目的:
- 引入和验证一个新的触点多能极紫外线 (EUV) 和高贝塔托卡马克扩展脉冲的软X射线诊断系统.
- 为了使电子温度测量和分析200 eV以下核心等离子体的模式动态.
- 评估系统的性能,包括杂质和过器特性的影响.
主要方法:
- 实施一个接触式多能EUV和软X射线诊断系统.
- 开发和使用具有五个双波组 (0.1μm Al和0.2μm Ti) 的过轮.
- 应用"双"技术,从排放档案中重建电子温度档案.
主要成果:
- 该系统成功地测量了电子温度配置文件,并检查了模式动态.
- 尽管由于杂质和氧化物而导致绝对温度值的潜在偏差,但在牙事件期间的轮形状和反转半径是一致的.
- 诊断有效地检测和分析内部磁动力学现象,特别是牙振荡.
结论:
- 新的接触式诊断系统适用于托卡马克的核心等离子体研究.
- 该系统能够始终捕捉关键的等离子体动态,如牙逆转半径的能力,验证了它的实用性.
- 这种诊断技术提高了研究聚变装置中低温状态下的等离子体行为的能力.
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