在低温扫描道显微镜中校准的微波反射率
Bareld Wit1, Georg Gramse2, Stefan Müllegger1
1Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz, 4040 Linz, Austria.
The Review of scientific instruments
|October 5, 2023
概括
我们介绍了一种用于校准扫描道显微镜中微波反射测量的新方法. 这种技术使得在GHz频率和冷温度下能够对介电性质进行纳米级成像和光谱.
科学领域:
- 凝聚物质物理学 凝聚物质物理学
- 表面科学是一门学科.
- 纳米技术 纳米技术
背景情况:
- 扫描道显微镜 (STM) 是用于原子尺度成像的强大工具.
- 在纳米级测量介电性质需要先进的技术.
- 由于阻抗不匹配,STM中的高频测量具有挑战性.
研究的目的:
- 开发一种校准的方法来测量从STM道交叉点的微波反射系数.
- 为了使纳米级显微镜和光谱在GHz频率和冷温度的介电表面特性.
- 在单分子极限实现介电指纹.
主要方法:
- 微波电路的详细设计,带有干扰计,用于增强信号噪声比.
- 实施用于锁定检测的解调方案.
- 量化,在现场阻抗校准使用数值三误期模型和同时测量导电量和微波反射收缩曲线.
主要成果:
- 从STM道交叉点成功校准了微波反射系数测量.
- 展示了一种利用由于亚纳米距离变化的道导电率变化的程序.
- 通过最小正方形匹配同时传导和反射数据实现实验性校准.
结论:
- 开发的方法允许精确的纳米尺度测量介电表面特性.
- 这为GHz频谱学和低温压电指纹的新途径开辟了道路.
- 该技术对单分子介电分析具有前景.
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