Jove
Visualize
联系我们
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

Protein Adsorption Kinetics on Silica: Theoretical Modeling and Experiments.

Langmuir : the ACS journal of surfaces and colloids·2026
Same author

Kinetics of Macroion Adsorption on Silica: Complementary Theoretical and Experimental Investigations for Poly-l-arginine.

Langmuir : the ACS journal of surfaces and colloids·2025
Same author

Deposition of Human-Serum-Albumin-Functionalized Spheroidal Particles on Abiotic Surfaces: Reference Kinetic Results for Bioparticles.

Molecules (Basel, Switzerland)·2024
Same author

Cu-Containing Faujasite-Type Zeolite as an Additive in Eco-Friendly Energetic Materials.

Molecules (Basel, Switzerland)·2024
Same author

Quartz Crystal Microbalance Frequency Response to Discrete Adsorbates in Liquids.

Analytical chemistry·2024
Same author

Kinetics of Human Serum Albumin Adsorption on Polycation Functionalized Silica.

Biomolecules·2024

相关实验视频

Updated: Jul 13, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.8K

量化纳米粒子层拓学:理论建模和原子力显微镜研究

Zbigniew Adamczyk1, Marta Sadowska1, Małgorzata Nattich-Rak1

  • 1Jerzy Haber Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences, Niezapominajek 8, 30-239 Krakow, Poland.

Langmuir : the ACS journal of surfaces and colloids
|October 12, 2023
PubMed
概括

一种新方法使用理论建模和原子力显微镜 (AFM) 来分析纳米粒子层地形. 这种方法可以准确地确定纳米粒子覆盖范围,无论粒子的形状或大小如何,简化了表面表征.

科学领域:

  • 表面科学是一门学科.
  • 纳米技术纳米技术
  • 材料科学 材料科学 材料科学

背景情况:

  • 纳米粒子层的准确表征对于自组装研究至关重要.
  • 纳米粒子拓的定量分析由于不同的粒子形状和大小带来了挑战.

研究的目的:

  • 开发一种全面的方法,用于对纳米粒子层拓的定量分析.
  • 为了能够轻松确定颗粒覆盖范围,无论颗粒的形状和大小如何.

主要方法:

  • 结合理论建模与实验原子力显微镜 (AFM) 测量.
  • 获得了各种粒子形状的分析结果,包括圆柱体,磁盘,圆体和半球.
  • 通过计算机建模和对聚合物纳米颗粒的实验AFM数据验证的结果.

主要成果:

  • 粗度参数"平方根平均值" (rms) 显示所有粒子形状的最大覆盖率约为0.5.
  • 斜率被确定为覆盖率的单调下降的函数.
  • 在没有事先了解形状和大小的情况下,可以轻松确定颗粒覆盖面.

结论:

  • 开发的地形分析方法为描述纳米粒子层提供了强大的工具.

更多相关视频

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry
08:18

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

1.8K
Atomically Traceable Nanostructure Fabrication
12:35

Atomically Traceable Nanostructure Fabrication

Published on: July 17, 2015

8.8K

相关实验视频

Last Updated: Jul 13, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.8K
Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry
08:18

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

1.8K
Atomically Traceable Nanostructure Fabrication
12:35

Atomically Traceable Nanostructure Fabrication

Published on: July 17, 2015

8.8K
  • 适用于广泛的纳米和生物颗粒,包括碳纳米管,蛋白质和病毒.
  • 允许精确的校准和测量精度的确定,用于显微镜技术,如AFM.