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Updated: Jul 13, 2025

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
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开发适应点扩散函数估计方法,用于X射线成像的各种闪光探测器厚度的X射线成像.

Bo Kyung Cha1, Youngjin Lee2, Kyuseok Kim3

  • 1Precision Medical Device Research Center, Korea Electrotechnology Research Institute (KERI), 111, Hanggaul-ro, Sangnok-gu, Ansan-si 15588, Gyeonggi-do, Republic of Korea.

Sensors (Basel, Switzerland)
|October 14, 2023
PubMed
概括

这项研究引入了一种新的方法,通过将正常厚度的闪光灯图像转换为薄厚度探测器等价物来提高X射线图像质量. 该技术优化了空间分辨率,同时最大限度地减少噪音和文物,以改善诊断成像.

关键词:
适应性点差函数的适应性点差函数图像质量评估 图像质量评估图像恢复 图像恢复 图像恢复没有盲目的解卷.闪器的厚度是什么

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X-ray Crystallography02:18

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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