Ziwei Tian1, Sha Huang2, Shirui Wen2

  • 1Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China; University of Chinese Academy of Sciences, Beijing 101408, China; Key Laboratory of Spectral Imaging Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China.

Epilepsy & behavior : E&B
|October 15, 2023
PubMed
概括

叶 (TLE) 患者由于大脑活动的改变而表现出情节性记忆 (EM) 损伤. 与事件相关的潜能 (ERP) 揭示了与TLE记忆缺陷相关的特定电生理变化.

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