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增强可见光光探测与未使用和使用ZnO薄膜自动供电光探测器的可见光光探测

Manohar Singh¹, Anit Kumar Ambedkar¹, Shrestha Tyagi¹

¹Department of Physics, Chaudhary Charan Singh University, Meerut 250004, India.

|October 16, 2023

概括

用铜添加氧化物 (CZO) 薄膜创建稳定,自动供电的可见光光探测器,性能提高. 这一突破为先进的光电探测器开发提供了有前途的途径.

科学领域:

材料科学材料科学材料科学
光电学是指光电子产品.
半导体物理半导体物理

背景情况:

光探测对现代技术至关重要,但制造稳定的光探测器仍然具有挑战性.
未使用氧化物 (UZO) 和氧化物 (CZO) 薄膜正在探索可见光光检测应用.

研究的目的:

在基板上使用UZO和CZO薄膜制造和表征自动供电光探测器.
为了比较基于CZO的光学探测器与基于UZO的光学探测器的性能.

主要方法:

在n型Si基板上制造了UZO和CZO的薄膜,使用了反应性Cosputtering.
使用XRD,FESEM,XPS,AFM和PL光谱分析了结构,形态和光学特性.
评估了光检测性能指标,如开/关比,响应性和检测性.

主要成果:

与UZO/n-Si设备相比,CZO/n-Si光电探测器表现出优越的开/关比,响应能力和检测能力.
该CZO/n-Si光探测器在20个周期中表现出高稳定性和可重复性,即使在180天后.
在可见光下,CZO/n-Si的高开/关比约为300,特定检测能力为2.8 × 10^10斯.

结论:

铜剂显著提高了基于ZnO的可见光光探测器的性能.
开发的自动供电CZO/n-Si光电探测器显示了高性能光电子应用的巨大潜力.
这项研究为新,稳定和高效的光探测器设计铺平了道路.

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