极化白光干涉测量用于使用两个同时干涉图进行相位测量
Applied optics
|October 19, 2023
概括
这项研究介绍了一种新型的极化相移白光干扰度系统 (PPS-WLIS),用于测量透明物体的斜率. 该系统简化了相位移干扰计,使单次捕获动态事件分析成为可能.
科学领域:
- 光学物理学的光学物理学
- 计量学 计量学 计量学
- 干涉测量是干涉测量的方法.
背景情况:
- 阶段转移干扰测量对于精确的光学测量至关重要.
- 传统的方法可能很复杂,需要多次捕获.
- 测量透明物体的斜率相具有独特的挑战.
研究的目的:
- 设计和演示一个极化相位移白光干扰度系统 (PPS-WLIS).
- 为了使透明物体的斜率相的传输模式测量.
- 为了简化相位移干扰计,用于动态事件分析.
主要方法:
- 连接一个循环路径干扰仪与多重复的迈克尔森干扰仪.
- 利用极化生成两个同时调制的并行干涉图.
- 采用两步相变调算法,而不需要精确的相位移.
主要成果:
- 成功观察了与光学相变相关的物体变化.
- 简化,单次捕获的相位移干涉测量过程的演示.
- 作为一个应用程序,精确测量火焰部分的温度.
结论:
- 开发的PPS-WLIS提供了一种简单有效的方法来测量斜率相位.
- 该系统的单次捕获能力使其非常适合动态光学事件分析.
- 这种技术推进了透明的物体计量学和实时光学分析.
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