HfO2

Wei Tong1, Wei Wei2, Xiangzhe Zhang3

  • 1Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, China.

Nano letters
|October 20, 2023
PubMed
概括

研究人员通过暴露记忆层来可视化记忆器的不稳定性. 通过改善与范德瓦尔斯电极的接口质量,实现了单线程切换,以实现可靠的神经形态计算.