Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
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D Sreeshma1, K S R Koteswara Rao1
1Department of Physics, Indian Institute of Science, Bangalore, Karnataka 560012, India.
一个新的基于微控制器的深层次暂时光谱 (DLTS) 系统,利用Arduino-Due,有效地识别半导体缺陷. 这种具有成本效益和准确的系统简化了缺陷分析,提供了多功能应用.
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