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相关概念视频

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

234
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
234
Tandem Mass Spectrometry01:21

Tandem Mass Spectrometry

1.0K
Tandem mass spectrometry is a technique that uses multiple mass analyzers in series to obtain a higher selectivity and signal-to-noise ratio for the analyte. Instruments with multiple analyzers separated by an interaction cell enable secondary fragmentation and selected study of the fragment ions.
Secondary fragmentations occur in the interaction cell and can be induced by various factors. Fragmentation induced by collision with inert gases, such as N2, Ar, He, etc., is called collision-induced...
1.0K

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Integrated diamond quantum spectrometer for high-resolution picoliter nuclear magnetic resonance (NMR) under ambient magnetic noise.

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Asymmetric-beam steady-state thermoreflectance for three-dimensional anisotropic thermal conductivity measurements.

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相关实验视频

Updated: Jul 12, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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单个热扫描数字系统用于深层瞬态光谱学.

D Sreeshma1, K S R Koteswara Rao1

  • 1Department of Physics, Indian Institute of Science, Bangalore, Karnataka 560012, India.

The Review of scientific instruments
|October 20, 2023
PubMed
概括

一个新的基于微控制器的深层次暂时光谱 (DLTS) 系统,利用Arduino-Due,有效地识别半导体缺陷. 这种具有成本效益和准确的系统简化了缺陷分析,提供了多功能应用.

科学领域:

  • 材料科学 材料科学 材料科学
  • 电气工程 电气工程
  • 半导体物理 半导体物理

背景情况:

  • 半导体的深层次缺陷对设备性能产生重大影响.
  • 传统的深层瞬态光谱 (DLTS) 系统可能是复杂而昂贵的.
  • 准确地描述这些缺陷对于半导体开发至关重要.

研究的目的:

  • 开发一种基于微控制器的新,具有成本效益和用户友好的深度层次暂时光谱 (DLTS) 系统.
  • 实施先进的信号处理算法用于缺陷识别.
  • 用精确的半导体样本验证系统的性能.

主要方法:

  • 开发一个集成Arduino-Due,电容计和接口电路的DLTS系统.
  • 实现定制算法用于数字控制充电脉冲生成,数据采集和信号处理.
  • 制造和测试黄金合p-n连接样本,以验证系统的准确性.

主要成果:

  • 基于微控制器的DLTS系统成功地发现了中的深层缺陷.
  • 计算的缺陷参数 (能量,捕获截面,度) 与文献值有很好的一致性.
  • 该系统展示了50 ns的最小脉冲宽度和高数据采集分辨率.

更多相关视频

Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo
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Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface
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Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface

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相关实验视频

Last Updated: Jul 12, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.7K
Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo
08:01

Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo

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Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface
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Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface

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结论:

  • 开发的基于微控制器的DLTS系统为半导体缺陷分析提供了简单,廉价和准确的解决方案.
  • 系统的数字控制和高效处理将错误和实验时间降到最低.
  • 该系统的多功能性得到了成功应用于金化的证实.