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Updated: Jul 12, 2025

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
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双色紫外线检测系统用于原子分辨率的离子成像

T Nordmann1, S Wickenhagen2, M Doležal3

  • 1Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany.

The Review of scientific instruments
|October 20, 2023
PubMed
概括

我们开发了一种紧的成像系统,用于使用深紫外线和可见光同时检测两个离子物种的空间分辨率. 这项技术可以精确检测被困离子晶体的状态,适用于各种双种实验.

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