SiC,

G Ntshobeni1, Z A Y Abdalla1, T F Mokgadi1

  • 1Physics Department, University of Pretoria, Pretoria, South Africa.

Heliyon
|October 23, 2023
PubMed
概括

,银和离子在碳化 (SiC) 中的三重植入造成了缺陷和He纳米泡. 化治愈了一些缺陷,气泡促进了银和的迁移和捕获.