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一种用于评估航空航天集成电路单事件效应的快速模拟方法

Xiaorui Zhang¹, Yi Liu¹, Changqing Xu^1,2

¹Laboratory of Digital IC and Space Application, School of Microelectronics, Xidian University, Xi'an 710071, China.

|October 28, 2023

概括

本研究引入了一种改进的多点故障注入方法,以提高航空航天集成电路中单事件效应 (SEE) 的仿真效率. 新方法通过验证单个工作负载执行中的多个故障来加速测试,从而改善可靠性评估.

科学领域:

电气工程电气工程
计算机科学计算机科学

背景情况:

集成电路技术的进步需要对航空航天应用进行强有力的可靠性评估.
单一事件效应 (SEE) 对航空航天集成电路的完整性构成重大威胁.
传统的故障注入模拟由于掩盖效应和每次执行一次故障的方法而低效.

研究的目的:

提高航空航天集成电路中模拟单事件效应 (SEE) 的效率.
解决传统和一般多点故障注入方法的局限性.
开发一种方法,可以准确地识别导致错误的故障,即使是多次注射.

主要方法:

为计算机模拟提出了一种改进的多点故障注入技术.
实施了一种工作负载执行策略,允许每次运行多次故障注入.
开发了一个故障分组机制,以便在发生错误时确定特定的引发错误的故障.

主要成果:

改进的方法显著加快了模拟过程.
在单个工作负载执行中成功验证了多个错误.
通过分组方法,能够准确识别导致错误的故障.

结论:

拟议的多点故障注入方法为SEE模拟提供了相当大的加速效应.
这种技术有效地克服了以前的故障注入策略的低效率和模糊性问题.
改进的方法通过提高模拟效率来提高航空航天集成电路的可靠性分析.

关键词:

航空航天集成电路集成电路分组方法分组方法.多点故障注入方法多点故障注入方法一个单一事件的效应.

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