模拟边缘投射形计的测量精度
1School of Computer Science and Engineering, Nanyang Technological University, Singapore, Singapore.
Light, science & applications
|October 30, 2023
概括
本研究介绍了第一个完整的理论模型,用于边缘投射形计 (FPP) 精度. 它将摄像头参数与相位精度连接起来,并定义几何测量精度,从而实现更好的FPP系统设计.
科学领域:
- 计量学和精密工程 精密工程
- 光学测量技术的使用
背景情况:
- 三维 (3D) 表面几何在科学和工程方面至关重要.
- 边缘投影分析 (FPP) 是一种高精度,非接触的3D测量技术.
- 目前的FPP精度评估是实验性的,缺乏理论基础.
研究的目的:
- 开发FPP的第一个完整的理论精密模型链.
- 为了建立相机电子和相位精度之间的连接.
- 为了提供3D几何测量精度的明确表示.
主要方法:
- 开发了一个四个阶段的精确模型链 (摄像头强度,边缘强度,相位,3D几何).
- 整合了两个传输模型 (边缘强度到相位,相位到3D几何).
- 使用非高斯相机噪声模型将相机参数与相位精度联系起来.
主要成果:
- 建立了一个完整的FPP精度模型来描述现有系统.
- 为明确的精确表示而制定的相向几何转移.
- 确定了最高可能的精度极限,以指导未来的FPP系统设计.
结论:
- 理论模型使FPP成为一种更容易设计的技术.
- 这些模型针对不同尺度 (从宏观到微观) 的不同测量需求.
- 这项工作指导了针对特定精度要求的FPP系统的优化.
相关概念视频
03:37Uncertainty in Measurement: Accuracy and Precision
73.8K
Scientists typically make repeated measurements of a quantity to ensure the quality of their findings and to evaluate both the precision and the accuracy of their results. Measurements are said to be precise if they yield very similar results when repeated in the same manner. A measurement is considered accurate if it yields a result that is very close to the true or the accepted value. Precise values agree with each other; accurate values agree with a true value.
73.8K
01:08Atomic Force Microscopy
3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K