K-X线

Yirong Su1, Peng Ran1, Juan Hui1

  • 1State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China.

概括

这项研究引入了一种使用K边缘吸收系数的新方法,用于在X射线成像中选择多层闪器. 这使得精确的X射线光谱推断成为可能,改善了物质密度歧视.

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