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使用稀疏扫描凯尔文探针力显微镜的表面电荷动态的高速映射

Marti Checa¹, Addis S Fuhr², Changhyo Sun³

¹Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA. checam@ornl.gov.

Nature communications

|November 8, 2023

概括

高速稀疏扫描凯尔文探针力显微镜使纳米级电荷动态的次秒成像成为可能. 这一突破可视化了离子扩散和氧气空缺,推进了微电子和储能研究.

科学领域:

材料科学材料科学材料科学
表面科学是一门学科.
物理化学物理化学

背景情况:

了解局部动态充电过程对于微电子和储能至关重要.
在多个长度和时间尺度上映电荷载体运动是必不可少的.
材料异质性显著影响电荷动态.

研究的目的:

介绍一种新的高速稀疏扫描凯尔文探针力显微镜技术.
为了实现纳米级电荷动态的次秒成像.
在材料系统中可视化和量化离子电荷载体运动.

主要方法:

高速稀疏扫描凯尔文探针力显微镜 (KPFM) 与图像重建.
纳米级电荷动态的次秒成像 (每秒超过3).
与宏观尺度设备测量的集成.

主要成果:

在LaAlO3/SrTiO3装置上可视化移动表面离子的电化学介导扩散.
在多晶TiO2.2中单粒级监测氧气空隙扩散.
确定TiO2的电荷扩散激活能量为0.18 eV,通过DFT计算得到证实.

结论:

开发的高速KPFM技术显著提高了纳米级电荷动态的成像速率.
该方法有效地可视化了离子电荷载体运动,影响了对异质接口和材料性质的理解.
这种多功能技术为研究微电子和纳米系统中的电荷传输提供了新的可能性.

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