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Updated: Jul 11, 2025

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

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使用凯尔文探针力显微镜与qPlus传感器AFM使用GaAs p-n连接处内置的潜在形状的定量表征

Nobuyuki Ishida1, Takaaki Mano1

  • 1National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.

Nanotechnology
|November 9, 2023
PubMed
概括

凯尔文探针力显微镜 (KPFM) 准确地测量材料中的表面潜力. 这项研究证实了KPFM的存在.

关键词:
在GaAs中(110)凯尔文探针强力显微镜凯尔文探测器力量光谱法在 p n 交叉口.qPlus 传感器的传感器

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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