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Updated: Jul 11, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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接触共振原子力显微镜使用长弹性尖端

Nadav Zimron-Politi1, Ryan C Tung1

  • 1Department of Mechanical Engineering, University of Nevada, Reno, 1664 N. Virginia St., Reno, NV 89557-0312, United States of America.

Nanotechnology
|November 10, 2023
PubMed
概括

接触共振原子力显微镜 (AFM) 的新理论模型使用L形光束模型准确预测样本刚度. 该模型增强了对动态现象的理解,并在微系统中有应用.

关键词:
原子力显微镜的原子力显微镜.接触式共振是一种接触式共振.长长的弹性尖端弹性尖端这是一个纳米针.qPlus 传感器的传感器

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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