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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Jul 11, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

接触共振原子力显微镜使用长弹性尖端.

Nadav Zimron-Politi¹, Ryan C Tung¹

¹Department of Mechanical Engineering, University of Nevada, Reno, 1664 N. Virginia St., Reno, NV 89557-0312, United States of America.

|November 10, 2023

概括

此摘要是机器生成的。

接触共振原子力显微镜 (AFM) 的新理论模型使用L形光束模型准确预测样本刚度. 该模型增强了对动态现象的理解,并在微系统中有应用.

关键词:

原子力显微镜的原子力显微镜.接触式共振是一种接触式共振.长长的弹性尖端弹性尖端这是一个纳米针.qPlus 传感器的传感器

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Last Updated: Jul 11, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Published on: December 2, 2022

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科学领域:

物理物理学物理
材料科学材料科学材料科学
机械工程机械工程

背景情况:

接触共振原子力显微镜 (AFM) 是材料表征的一个关键技术.
现有的模型可能无法完全捕捉到AFM传感尖端的复杂弹性动态.
了解尖端样本相互作用对于高分辨率成像和物业映射至关重要.

研究的目的:

开发一种新的接触共振AFM理论模型.
为了结合一个长感应尖端的弹性动态,特别是一个"L形"光束.
为了能够高精度地预测样本度,并分析动态现象.

主要方法:

利用欧勒-伯努利束理论来建模传感尖端.
两个梁结构的内置合效应,形成一个L形梁.
分析了多种振动模式,以预测样本的刚性和动态行为.

主要成果:

实现了对样品刚度的高精度预测,实际范围的相对误差低于10%.
证明了模型能够预测自身模式转向和交叉现象的能力.
验证了接触共振AFM模拟的理论框架.

结论:

开发的L形光束模型在接触共振AFM方面取得了重大进展.
该模型准确地预测了样本的刚度,并揭示了复杂的动态相互作用.
该理论框架具有超越AFM的潜在应用,包括MEMS和能源采集.