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Updated: Jul 13, 2026

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无放射性核素效率校准的HPGe探测器使用单色光子束校准与一个冷辐射计的单色光子束

Víctor H Elvira¹, Marie-Christine Lépy¹, Yves Ménesguen¹

¹Université Paris-Saclay, CEA, LIST, Laboratoire National Henri Becquerel (LNE-LNHB), F-91120, Palaiseau, France.

Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine

|November 11, 2023

概括

这项研究使用冷放射仪校准光子束,以确定HPGe探测器的效率. 研究人员计算了死层厚度和高达55keV的效率.

科学领域:

核仪器仪表与计量学核仪器仪表与计量学
探测器物理学的物理

背景情况:

精确的效率测定对于HPGe探测器至关重要.
基于同步子光子束的光子束提供精确的校准源.

研究的目的:

使用低温电置换辐射计对单色光子束进行校准.
为了确定高纯度 (HPGe) 探测器的内在效率.
为了计算HPGe探测器的死层厚度和整体效率.

主要方法:

在同步机上对单色光子束的初级校准.
测量HPGe探测器在3.5 keV和8 keV之间的效率.
确定死层厚度和高达55 keV的效率.
在可变距离上使用放射性源测量几何效率.

主要成果:

确定了HPGe探测器的内在效率.
死亡层的厚度被精确计算出来.
检测器的效率被计算为55 keV,考虑到主动厚度的限制.

结论:

该方法为HPGe探测器效率校准提供了可靠的方法.
死亡层的表征对于在更高的能量下准确地确定效率至关重要.
同步子辐射与低温放射测量相结合,可以实现精确的探测器计量.

关键词:

低温检测仪低温检测仪有效性校准的校准效率.光子发射强度的光子发射强度.半导体检测器半导体检测器同步子辐射的辐射.

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