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Updated: Jul 11, 2025

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
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在二次离子质谱图像中比较片人工物去除方法

Sevvandi Kandanaarachchi1, Wil Gardner2, David L J Alexander1

  • 1CSIRO's Data61, Research Way, Clayton, Victoria 3168, Australia.

Analytical chemistry
|November 14, 2023
PubMed
概括

飞行时间二次离子质谱 (ToF-SIMS) 成像中的制文物具有挑战性. 这项研究评估了六种计算方法,发现没有一种单一的普遍有效的方法来删除这些文物,性能取决于特定的数据集.

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