ETLIII-V

Pan Xia1, Tong Zhu1, Muhammad Imran1

  • 1Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.

概括

这项研究解决了III-V体量子点 (CQD) 红外光探测器的稳定性问题. 一个新的混合孔运输层显著提高了设备的寿命和性能保留.