TEM

Toshie Yaguchi1, Mia L San Gabriel2, Ayako Hashimoto3,4

  • 1Electron Microscope Systems Design Department, Hitachi High-Tech Corporation, 552-53 Shinko-cho, Hitachinaka-shi, Ibaraki-ken 312-8504, Japan.

PubMed
概括

本综述探讨了现场传输电子显微镜 (TEM) 的先进样本持有器,重点关注用于环境研究的加热方法和微电机系统 (MEMS) 芯片集成.