使HT-CNNHex-D-VCC

S Thenappan1, C A Arun2

  • 1Electronics and Communication Engineering, Vel Tech Rangarajan Dr.Sagunthala R&D Institute of Science and Technology, Chennai, India. drthenappans@veltech.edu.in.

概括

早期识别小麦叶病使用一种新的基于超参数tanh的卷积神经网络 (HT-CNN) 提高了作物产量. 这种方法准确地预测疾病和严重程度,优于现有的技术.