GaNHEMT:

Xiazhi Zou1,2, Jiayi Yang1,2, Qifeng Qiao3

  • 1School of Microelectronics, Shanghai University, Shanghai 200444, China.

Micromachines
|November 25, 2023
PubMed
概括

本研究回顾了高电子流动性晶体管 (HEMT) 中化 (GaN) 的陷特征,这对于提高动力设备可靠性至关重要. 了解陷位置和能量水平是克服GaN HEMT稳定性挑战的关键.

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