基于金属氧化物半导体场效应晶体管有效空间电荷的单事件过渡的改进模型
Yutao Zhang1, Hongliang Lu1, Chen Liu1
1Key Laboratory for Wide Band Gap Semiconductor Material and Devices of Education Ministry, School of Microelectronics, Xidian University, Xi'an 710071, China.
Micromachines
|November 25, 2023
概括
这项研究为MOSFET单事件瞬态引入了一个新的基于物理的模型,改进了软误差率估计. 该模型准确地预测了设备在辐射下的行为,超过了经典模型.
科学领域:
- 半导体物理 半导体物理
- 微电子学微电子学
- 辐射的影响 辐射效应
背景情况:
- 在MOSFET中,单事件瞬态 (SET) 对电子可靠性至关重要.
- 现有的模型在预测各种条件下的短暂行为时往往缺乏准确性.
研究的目的:
- 为使用有效空间电荷的MOSFET SETs提出一种新的基于物理的模型.
- 为了准确地描述排水电流脉冲,考虑到电荷沉积和运动.
- 通过对TCAD和电路级模拟来验证模型的性能.
主要方法:
- 在MOSFET中详细分析电荷沉积和运动物理.
- 开发一种基于物理学的模型,包括两极扩散和电场动态.
- 使用技术计算机辅助设计 (TCAD) 和SPICE模拟的验证.
主要成果:
- 拟议的模型与TCAD模拟非常一致 (RMSE<3.7 × 10-4).
- 与经典模型相比,电路层面的模拟显示了预测电压和电流变化的更高准确性.
- 该模型准确地捕捉了当前的平原效应,并减少了脉冲宽度误差.
结论:
- 新模型为MOSFET中的SET分析提供了更准确,更有效的方法.
- 它为改善电路层面软误差率 (SER) 估计提供了潜力.
- 该模型的精度和效率使其适合在辐射硬化电子设备中的实际应用.
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