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金属微支柱的局部结构变化是由等离子聚焦离子束处理引起的.

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科学领域:

  • 材料科学 材料科学 材料科学
  • 纳米技术纳米技术
  • 表面科学是一门学科.

背景情况:

  • 聚焦离子束扫描电子显微镜 (FIB-SEM) 对于微/纳米尺度成像和制造至关重要.
  • 在FIB-SEM中的离子样品相互作用可以导致诸如离子植入和材料重新配置之类的工件.
  • 血聚焦离子束 (PFIB) 削是一种用于准备样品的技术.

研究的目的:

  • 分析通过PFIB削制备的金属微柱中的晶格扭曲和离子植入.
  • 为了研究离子能量对离子植入和再定位的影响.
  • 量化磨料材料中诱导的应变场.

主要方法:

  • 使用PFIB用Xe+离子在10keV和30keV的压方法制备金属微支柱.
  • 非破坏性同步子技术,包括X射线光 (XRF) 和X射线纳米衍射.
  • 对格子扭曲,离子植入密度和应变场的分析.

主要成果:

  • 较高的Xe+离子能量 (30keV与10keV相比) 导致重新沉积和磨砂材料中植入的离子密度更高.
  • 在重新沉积的材料中,离子混合显著影响了格子结构,导致变形.
  • 通过X射线纳米衍射,揭示了沿离子轰炸方向有高达0.2%的晶格扭曲的应变场.

结论:

  • PFIB削参数,特别是离子能量,极大地影响了离子植入和材料重置.
  • 了解和量化离子诱导的工件对于准确的纳米级材料表征和制造至关重要.
  • 基于同步的X射线技术为离子束处理引起的微观结构变化提供了宝贵的见解.