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Jun Su1, Wei He1, Yingguan Wang1
1Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, University of Chinese Academy of Sciences, Shanghai 200050, China.
本研究引入了一种新的一次性物体检测模型,用于有限数据的项目. 该模型自动确定其架构,并使用单一图像检测目标,在现实世界和基准数据集中证明有效.
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