在使用qPlus传感器的扫描探头实验中,关于道电流和激发之间的交叉合的起源和消除
Michael Schelchshorn1, Fabian Stilp1, Marco Weiss1
1University of Regensburg, Institute of Experimental and Applied Physics, Universitätsstrasse 31, D-93040 Regensburg, Germany.
The Review of scientific instruments
|November 27, 2023
概括
在扫描道显微镜 (STM) 和原子力显微镜 (AFM) 中的交叉合是由电压下降引起的. 这项研究解释了这一现象,并提供了一个解决方案,以防止在qPlus传感器操作中出现不必要的振荡.
科学领域:
- 表面科学是一门科学.
- 纳米技术 纳米技术
- 显微镜的使用方法
背景情况:
- qPlus传感器使扫描道显微镜 (STM) 和原子力显微镜 (AFM) 的同时操作成为可能.
- 在高道电流下,在结合的STM/AFM系统中观察到一种以前无法解释的道电流诱导的交叉合现象.
研究的目的:
- 调查QPlus传感器STM/AFM系统中道电流诱导交叉合的起源.
- 通过理论和实验阐明这种交叉合背后的机制.
- 提出一种方法来防止电流诱导的激发或阻尼.
主要方法:
- 交叉合现象的理论建模.
- 使用qPlus传感器对理论模型进行实验验证.
- 在电流布线中分析电压下降和RC元件.
主要成果:
- 交叉合源于微伏级电压下降,激发或抑制基于电流信号的振荡.
- 电线中的内在RC组件引入相位转移,使这种激发或抑制成为可能.
- 开发的理论模型准确地描述了实验观测.
结论:
- 该研究为长期观察到的qPlus传感器STM/AFM中的电流诱导交叉合提供了全面的解释.
- 已经提出了一种减轻或预防这种现象的方法.
- 了解这种效应对于优化联合显微镜技术的高电流操作至关重要.
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