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Updated: Jul 9, 2025

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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对于测量软物质表面,AFM-IR的不同模式意味着什么?

Qing Xie1, Xiaoji G Xu1

  • 1Department of Chemistry, Lehigh University, 6 E Packer Avenue, Bethlehem, Pennsylvania 18015, United States.

Langmuir : the ACS journal of surfaces and colloids
|November 28, 2023
PubMed
概括

基于原子力显微镜的光热红外显微镜 (AFM-IR) 提供高分辨率的化学成像. 这一观点阐明了AFM-IR模式,讨论了纳米级接口分析的挑战和好处.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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