相关实验视频

Updated: Jul 9, 2025

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

双异质凯尔文探针力显微镜

Benjamin Grévin¹, Fatima Husainy¹, Dmitry Aldakov¹

¹Univ. Grenoble Alpes, CNRS, CEA, IRIG-SyMMES, 38000 Grenoble, France.

Beilstein journal of nanotechnology

|November 29, 2023

概括

我们开发了双异极基KPFM (DHe-KPFM) 来绘制时间周期表面电位的里埃光谱. 这种技术能够以高分辨率对动态表面特性进行详细分析.

科学领域:

表面科学是一门科学.
纳米尺度成像成像技术
频谱学是一种光谱学.

背景情况:

凯尔文探针力显微镜 (KPFM) 对于表面潜力分析至关重要.
现有的KPFM方法在分析时间周期潜力方面存在局限性.
光学或电气抽会产生动态的表面静电电位.

研究的目的:

引入一种新的开放循环KPFM实现,用于里埃频谱分析.
为了能够选择性地探测时间周期的表面潜力的波频率.
为了展示动态表面现象的先进成像和光谱能力.

主要方法:

利用双重异构频率混合效应.
使用悬臂机械振荡和ac偏差调制.
采用两个级联数值锁定放大器进行相连贯解调.
将特定的波频率转移到第二个杆特征模式.

主要成果:

开发了双异极丁KPFM (DHe-KPFM) 用于绘制潜在波的振幅和相位.
在第二个自身模式中实现了选择性波探测和信号解调.
展示了用于富里埃光谱记录的DHe-KPFM光谱学.
在数据立方体模式下获取2D动态图像.
成功地将DHe-KPFM应用于各种表面,包括有机光伏和矿纳米板.

结论:

DHe-KPFM为时间分辨率测量和表面光伏 (SPV) 成像提供了多功能功能.
该技术对弱的SPV信号敏感.
预计未来在光电子学和材料科学领域的改进和应用将会有所增加.

关键词:

KPFM KPFM是KPFM的一家公司.这是一个异质的异质.交互调节的方法在 nc-AFMM 中.表面光伏的表面光伏.时间分辨率测量测量.

更多相关视频

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Published on: November 28, 2014

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

相关概念视频

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...