半导体和绝缘体点缺陷的激发状态属性用时间依赖密度函数理论进行了研究
Yu Jin1, Victor Wen-Zhe Yu2, Marco Govoni2,3,4
1Department of Chemistry, University of Chicago, Chicago, Illinois 60637, United States.
Journal of chemical theory and computation
|December 1, 2023
概括
我们开发了一种高效的混合依赖时间密度函数理论 (TDDFT) 方法,用于计算大型固态系统中的激发状态. 这种方法对于理解材料中旋转缺陷的光学特性至关重要.
科学领域:
- 计算材料科学 计算材料科学
- 量子化学是一种量子化学.
- 固态物理 固态物理
背景情况:
- 精确预测激发状态属性对于理解材料中的光学现象至关重要.
- 现有的方法经常在大型系统的计算成本上扎,限制了对复杂缺陷的研究.
研究的目的:
- 开发和实施一个高效的混合时间依赖密度函数理论 (TDDFT) 公式,用于激发状态计算.
- 为了使大型固态系统的研究,有数百到数千个原子.
- 为了研究结构松在旋转缺陷的光学特性中的作用.
主要方法:
- 用分析力制定旋转保护和旋转翻转混合TDDFT.
- 在基于GPU和CPU的架构上实现加速技术.
- 应用于半导体和绝缘体的点缺陷 (钻石中的NV-,钻石中的SiV,SiC中的V2,MgO中的OV).
主要成果:
- 对于大型系统,高效计算激发状态属性.
- 激发状态结构放松对于光学特性的重要性.
- 准确预测特定旋转缺陷的光学吸收和发射机制.
结论:
- 开发的混合TDDFT方法为研究大型固态系统中的兴奋状态提供了有效的工具.
- 兴奋状态中的结构松对于解释和预测自旋缺陷的光学特性至关重要.
- 这项工作促进了对量子技术相关材料中自旋缺陷的理解.
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