相关实验视频

Updated: Jul 22, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
11:34

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

Published on: December 3, 2013

15.7K

微观边缘投影造型测量使用时间频率分割多重复合的反交叉式绝对相位检索方法

Dezhao Wang, Weihu Zhou, Zili Zhang

    Optics express
    |December 2, 2023
    PubMed
    概括

    这项研究引入了一种改进的微观边缘投影造型测量 (MFPP) 绝对相位检索方法. 新技术通过消除3D形状测量中的波交叉声来提高准确性和稳定性.

    更多相关视频

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization10:28

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

    Published on: July 5, 2016

    10.3K
    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes06:56

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

    Published on: May 23, 2017

    12.3K

    相关概念视频

    Atomic Force Microscopy01:08

    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
    The AFM Probe
    The probe is regarded as the heart of any AFM setup and comprises the...