用X射线光方法分析生物材料中的微量元素,并对矩阵效应进行校正
Igor F Mikhailov1, Anton I Mikhailov1, Svetlana S Borisova1
1National Technical University "Kharkiv Polytechnic Institute," 2, Kyrpychova Str., 61002 Kharkiv, Ukraine.
The Review of scientific instruments
|December 6, 2023
概括
这项研究引入了一种新的X射线光 (XRF) 方法,通过测量光强度和吸收来纠正矩阵效应. 这种技术在低原子数材料中实现了各种元素的低检测极限.
科学领域:
- 分析化学 分析化学
- 材料科学 材料科学 材料科学
- 频谱学是一种光谱学.
背景情况:
- 在X射线光 (XRF) 分析中的矩阵效应可以显著影响准确性.
- 精确的元素分析需要能够有效地纠正样本组成变化的方法.
- 现有的XRF技术可能面临敏感度和适用于不同样本矩阵的限制.
研究的目的:
- 开发和验证一种新的XRF方法,用于精确的元素量化.
- 在具有低原子数基数的样本中解决和纠正矩阵效应.
- 为广泛的元素建立一个敏感和多功能分析技术.
主要方法:
- 在单一的X射线光学方案中实现光辐射强度和样品吸收的同时测量.
- 使用复杂的二次银- (Ag-Ge) 发射器作为主要辐射源.
- 采用额外的二次发射器,可调节波长 (0.633至3.38 Å) 进行吸收测量.
- 在便携式能量分散式X射线光 (EDXRF) 光谱仪上组装X射线光学方案.
主要成果:
- 在K系列中实现了元素Ca (Z=20) 到Mo (Z=42) 的低检测极限,并在L系列中达到Cd (Z=48) 到Bi (Z=83) 的低检测极限.
- 成功确定了由标准溶液组成的未知样本中的杂质的质量分数.
- 证明了该方法对具有低原子数基础的材料的有效性.
结论:
- 拟议的方法有效地纠正EDXRF分析中的矩阵效应.
- 该技术为轻元素矩阵提供高灵敏度和广泛的元素覆盖.
- 这种方法为复杂样本的元素分析提供了强大的工具.
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