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Updated: Jul 9, 2025

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在冷EM数据收集过程中,由于辐射损伤引起的噪音的处理

Rick Huang1, Dan Shi2

  • 1Laboratory of Cell Biology, Center for Cancer Research, National Cancer Institute, Bethesda, MD 20892, USA.

Structure (London, England : 1993)
|December 8, 2023
PubMed
概括

在冷电子显微镜 (cryo-EM) 中的辐射损伤噪声会影响单粒子分析 (SPA),MicroED和冷电子断层扫描 (cryo-ET). SPA 方法可以识别和排除不良数据,而冷ET 则需要系统评估辐射损害.

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Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...
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