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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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Mass Analyzers: Common Types01:19

Mass Analyzers: Common Types

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The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
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Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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相关实验视频

Updated: Jul 9, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

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一个小型扫描设备,用于绘制充电束的概况.

P Moretto-Capelle1, E Panader1, L Polizzi1

  • 1Laboratoire Collisions Agrégats et Réactivité (LCAR), UMR5589 Université de Toulouse (UPS) and CNRS, 118 Route de Narbonne, F-31062 Toulouse, France.

The Review of scientific instruments
|December 8, 2023
PubMed
概括
此摘要是机器生成的。

我们开发了一种微型扫描仪,使用计算机断层扫描来测量带电粒子束密度. 这种设备精确地绘制电子束的配置文件,有助于聚焦和偏移控制.

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Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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相关实验视频

Last Updated: Jul 9, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
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Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
14:11

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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科学领域:

  • 粒子加速器和光束物理学
  • 图像和断层扫描技术的成像和断层扫描技术.
  • 带电粒子束的特征描述

背景情况:

  • 准确地描述带电粒子束对于加速器性能至关重要.
  • 传统的光束造型方法在分辨率或范围上可能受到限制.
  • 开发新的非侵入性技术对于先进的光束诊断至关重要.

研究的目的:

  • 介绍一款新型迷你扫描器设备的开发.
  • 利用计算机断层扫描进行充电粒子束的全横空间密度表征.
  • 为了证明设备在监控光束聚焦和偏移方面的能力.

主要方法:

  • 使用了一个安装在旋转线性翻译器上的电线扫描仪.
  • 计算机断层扫描重建算法应用于扫描数据.
  • 在一毫米电子束上进行了测试,其能量为200 eV,强度为100 nA.

主要成果:

  • 迷你扫描仪成功地描述了电子束的横向空间密度.
  • 该设备提供了详细的配置文件,可以有效监控光束参数.
  • 该系统展示了对光束聚焦和偏移的控制和监控能力.

结论:

  • 开发的迷你扫描仪是用于带电粒子束特征的有效工具.
  • 计算机断层扫描为重建详细的光束密度配置文件提供了一种强大的方法.
  • 这项技术推进了光束诊断,支持粒子加速器应用中的精确控制.