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Updated: Jul 8, 2025

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验证导电原子力显微镜在二维材料中缺陷量化方面的使用

Kaikui Xu1, Madisen Holbrook2, Luke N Holtzman3

  • 1Department of Aerospace and Mechanical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States.

ACS nano
|December 14, 2023
PubMed
概括

导电原子力显微镜 (CAFM) 可靠量化二维 (2D) 材料的缺陷,匹配扫描道显微镜 (STM) 的结果. 这种技术为过渡金属二二原化物 (TMD) 的缺陷分析提供了切实可行的替代方案.

关键词:
导电性原子力显微镜 导电性原子力显微镜缺陷 缺陷 缺陷 缺陷 缺陷扫描道显微镜扫描道显微镜过渡金属二甲基二甲基化物两个维的材料是二维材料.

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