对于在TEM或STEM中成像的厚光束敏感标本的Voxel剂量限制分辨率
1Physics Department, University of Alberta, Edmonton T6G 2E1, Canada.
概括
辐射损伤限制在厚样本中的分辨率,用剂量限制分辨率 (DLR) 来量化. 增加电子能量或使用重金属染色显著改善了用于TEM和STEM成像的DLR.
科学领域:
- 显微镜的使用方法
- 材料科学 材料科学 材料科学
- 生物物理学的生物物理.
背景情况:
- 辐射损伤是厚型标本高分辨率成像的主要限制.
- 了解剂量限制分辨率 (DLR) 对于优化成像参数至关重要.
- 现有的模型往往不能完全考虑厚厚的有机样本中的辐射效应.
研究的目的:
- 在厚的样本中量化辐射损伤所造成的分辨率限制.
- 为voxel剂量限制分辨率 (DLR) 提取一个分析公式.
- 评估电子能量和重金属染色对DLR的影响.
主要方法:
- 用于 voxel 剂量限制分辨率 (DLR) 的分析公式的导出.
- 将DLR公式应用于明亮场质量厚度对比成像.
- 对有机样本 (聚合物,生物) 的分析,厚度从400nm到20μm.
- 考虑从300 keV到3 MeV的电子能量和重金属染色.
主要成果:
- 辐射损伤,而不是透镜变异,决定了在典型剂量 (330 MGy) 的厚有机标本的TEM/STEM分辨率.
- 增加电子能量 (300 keV到3 MeV) 可以将DLR提高至2倍.
- 重金属染色使得DLR增强了高达3的因素.
- 从增加的电子剂量来看,Voxel DLR的改善是适度的 (与剂量的1/4功率成比例).
结论:
- 由于厚样本中的辐射损伤,Voxel DLR提供了评估成像分辨率限制的关键指标.
- 优化电子能量和使用重金属染色是减轻辐射损伤影响的有效策略.
- 衍生的DLR公式适用于TEM和STEM中的各种厚有机标本.
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