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为原子探头断层扫描准备水样的可扩展基质开发

Eric V Woods1, Se-Ho Kim1,2, Ayman A El-Zoka1,3

  • 1Department Mikrostrukturphysik und Legierungsdesign, Max-Planck-Institut für Eisenforschung, Düsseldorf, Germany.

Journal of microscopy
|December 20, 2023
PubMed
概括

为原子探头断层扫描 (APT) 准备生物标本是一项挑战. 新的纳米多孔α黄铜基板通过最小化聚焦离子束 (FIB) 的使用来简化样本准备,使APT在生物研究中得到更广泛的采用.

关键词:
原子探测器图形扫描 (tomohraphy) 是一种原子探测器图形.化-FIB是什么意思化原子探头断层扫描 (Cryo-atom probe tomography) 是一种用于测试的技术.样本的准备 样本的准备

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...