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Super-resolution Fluorescence Microscopy

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...

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相关实验视频

Updated: Jul 7, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

亚毫米分辨率和高精度的φ-OFDR使用复杂域无光化方法.

Kaijun Liu, Guolu Yin, Zeheng Zhang

|December 22, 2023

概括

这项研究引入了一种新的复杂域无声化方法,以克服 Φ-光学频域反射计 (Φ-OFDR) 中的相位噪声. 该技术显著提高了相位解封,提高了传感分辨率和精度.

科学领域:

光电学是指光电子产品.
光学传感传感器是什么?
信号处理信号处理

背景情况:

阶段噪声是 Φ-OFDR 中的一个关键限制,阻碍了高空间分辨率,精度和测量范围.
现有的方法很难有效地应对噪声和应变积累引起的阶段解封挑战.

研究的目的:

开发和验证一种新的复杂域无声化方法,用于在 Φ-OFDR.中有效地解封相位信号.
为了提高传感分辨率,精度和应变测量能力.

主要方法:

一种复杂域的否定方法,使用波段包分解在构造的复杂信号的真实和虚构部分.
空间位置校正算法以减轻应变积累导致的相位脱凝.
使用高数值孔径光纤来提高雷利散射强度.

主要成果:

达到0.89毫米的传感分辨率.
在应变测量中获得了1.5mE的根平均平方误差.
证明了最大的应变传感能力为2050mAh.
通过消除真实和虚构组件,成功地解封了相位信号.

结论:

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Digital Inline Holographic Microscopy DIHM of Weakly-scattering Subjects

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

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Last Updated: Jul 7, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Digital Inline Holographic Microscopy DIHM of Weakly-scattering Subjects

Digital Inline Holographic Microscopy DIHM of Weakly-scattering Subjects

Published on: February 8, 2014

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

拟议的复杂域无声化方法有效地解决了 Φ-OFDR 中的相位噪声.

综合方法显著提高了传感性能,使得高分辨率和高精度的应变测量成为可能.

这种技术为克服 Φ-OFDR 系统的关键局限性提供了强大的解决方案.